Advanced Test Methods for SRAMs : Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies by: Alberto Bosio Luigi Dilillo Patrick Girard Serge Pravossoudovitch Arnaud Virazel Modern electronics depends on nanoscaled technologies that present new challenges in terms of testing and d...
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| Hlavní autoři: | , , , , |
|---|---|
| Médium: | Livre numérique |
| Jazyk: | Anglais |
| Vydáno: |
New York, NY :
Springer US
2010.
Cham : Springer Nature |
| On-line přístup: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Poznámka: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Advanced Test Methods for SRAMs, Texte imprimé, 9781441909374 • Advanced Test Methods for SRAMs, Texte imprimé, 9781441909398 • Advanced Test Methods for SRAMs, Texte imprimé, 9781489983145 |
Obsah:
- Basics on SRAM Testing
- Resistive-Open Defects in Core-Cells
- Resistive-Open Defects in Pre-charge Circuits
- Resistive-Open Defects in Address Decoders
- Resistive-Open Defects in Write Drivers
- Resistive-Open Defects in Sense Amplifiers
- Faults Due to Process Variations in SRAMs
- Diagnosis and Design-for-Diagnosis.