CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test
As technology scales into nano-meter region, design and test of Static Random Access Memories (SRAMs) becomes a highly complex task. Process disturbances and various defect mechanisms contribute to the increasing number of unstable SRAM cells with parametric sensitivity. Growing sizes of SRAM arrays...
Sparad:
| Huvudupphovsmän: | , , |
|---|---|
| Materialtyp: | Livre numérique |
| Språk: | Anglais |
| Publicerad: |
Dordrecht :
Springer Netherlands
[20..].
Cham : Springer Nature |
| Upplaga: | 1st ed. 2008. |
| Serie: | Frontiers in Electronic Testing
40 |
| Länkar: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Anmärkning: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • CMOS SRAM circuit design and parametric test in nano-scaled technologies, 9781402083624 • CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies, Texte imprimé, 9789048178551 • CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies, Texte imprimé, 9789048117451 • CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies, Texte imprimé, 9781402083624 • CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies, Texte imprimé, 9789048178551 • CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies, Texte imprimé, 9789048117451 • CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies, Texte imprimé, 9781402083624 |