Applied scanning probe methods. XIII, Characterization
Crack initiation and growth are key issues when it comes to the mechanical reliab- ity of microelectronic devices and microelectromechanical systems (MEMS). Es- cially in organic electronics where exible substrates will play a major role these issues will become of utmost importance. It is therefore...
محفوظ في:
| المؤلف الرئيسي: | |
|---|---|
| مؤلفون آخرون: | |
| التنسيق: | Livre numérique |
| اللغة: | Anglais |
| منشور في: |
Berlin, Heidelberg :
Springer Berlin Heidelberg
[20..].
Cham : Springer Nature |
| الطبعة: | 1st ed. 2009. |
| سلاسل: | NanoScience and Technology
|
| الوصول للمادة أونلاين: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| ملاحظة: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Applied scanning probe methods XII, characterization, [edited by] Bharat Bhushan, Harald Fuchs, Berlin, Springer, 2009, 1 vol. (LV-224 p.), Nanoscience and technology, 978-3-540-85038-0 • Applied Scanning Probe Methods XII, Texte imprimé, 9783642098703 • Applied Scanning Probe Methods XII, Texte imprimé, 9783540873020 |
جدول المحتويات:
- Direct Force Measurements of Receptor Ligand Interactions on Living Cells Imaging Chemical Groups and Molecular Recognition Sites on Live Cells Using AFM Applications of Scanning Near-Field Optical Microscopy in Life Science Adhesion and Friction Properties of Polymers at Nanoscale: Investigation by AFM Mechanical Characterization of Materials by Micro-Indentation and AFM Scanning Mechanical Properties of Metallic Nanocontacts Dynamic AFM in Liquids: Viscous Damping and Applications to the Study of Confined Liquids Microtensile Tests Using In Situ Atomic Force Microscopy Scanning Tunneling Microscopy of the Si(111)-7.7 Surface and Adsorbed Ge Nanostructures