Applied scanning probe methods. III, Characterization
The Nobel Prize of 1986 on Sc- ning Tunneling Microscopy sig- led a new era in imaging. The sc- ning probes emerged as a new i- trument for imaging with a pre- sion suf?cient to delineate single atoms. At ?rst there were two the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope,...
Guardat en:
| Autor principal: | |
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| Altres autors: | |
| Format: | Livre numérique |
| Idioma: | Anglais |
| Publicat: |
Berlin, Heidelberg :
Springer Berlin Heidelberg
[20..].
Cham : Springer Nature |
| Edició: | 1st ed. 2006. |
| Col·lecció: | NanoScience and Technology
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| Accés en línia: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Nota: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Applied scanning probe methods III, characterization, edited by Bharat Bhushan, Harald Fuchs, Berlin, Springer, 2006, 1 vol. (XLIII-378 p.), Nanoscience and technology, 3-540-26909-6 • Applied Scanning Probe Methods III, Texte imprimé, 9783642065965 • Applied Scanning Probe Methods III, Texte imprimé, 9783540812654 |