Applied scanning probe methods. V, Scanning probe microscopy techniques
The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I IV that a large number of technical and applicational aspect...
محفوظ في:
| المؤلف الرئيسي: | |
|---|---|
| مؤلفون آخرون: | , |
| التنسيق: | Livre numérique |
| اللغة: | Anglais |
| منشور في: |
Berlin, Heidelberg :
Springer Berlin Heidelberg
[20..].
Cham : Springer Nature |
| الطبعة: | 1st ed. 2007. |
| سلاسل: | NanoScience and Technology
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| الوصول للمادة أونلاين: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| ملاحظة: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Applied scanning probe methods, V, Scanning probe microscopy techniques, Bharat Bhushan, Harald Fuchs, Satoshi Kawata (eds.), Berlin, Springer, 2007, 1 vol. (XIV- 344 p.), Nanoscience and technology, 3-540-37315-2 • Applied Scanning Probe Methods V, Texte imprimé, 9783642072116 • Applied Scanning Probe Methods V, Texte imprimé, 9783540827696 |