Applied scanning probe methods. VI, Characterization
The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I IV that a large number of technical and applicational aspect...
Gardado en:
| Outros autores: | , |
|---|---|
| Formato: | Livre numérique |
| Idioma: | Anglais |
| Publicado: |
Berlin, Heidelberg :
Springer Berlin Heidelberg : Springer e-books
[20..].
Cham : Springer Nature |
| Series: | NanoScience and Technology
|
| Acceso en liña: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Nota: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Applied scanning probe methods, VI, Characterization, Bharat Bhushan, Satoshi Kawata (eds.), Berlin, Springer, 2007, 1 vol. (XLV- 338 p.), Nanoscience and technology, 3-540-37318-7 |
Table des matières:
- Scanning Tunneling Microscopy of Physisorbed Monolayers: From Self-Assembly to Molecular Devices Tunneling Electron Spectroscopy Towards Chemical Analysis of Single Molecules STM Studies on Molecular Assembly at Solid/Liquid Interfaces Single-Molecule Studies on Cells and Membranes Using the Atomic Force Microscope Atomic Force Microscopy of DNA Structure and Interactions Direct Detection of Ligand-Protein Interaction Using AFM Dynamic Force Microscopy for Molecular-Scale Investigations of Organic Materials in Various Environments Noncontact Atomic Force Microscopy Tip-Enhanced Spectroscopy for Nano Investigation of Molecular Vibrations Investigating Individual Carbon Nanotube/Polymer Interfaces with Scanning Probe Microscopy