Applied scanning probe methods. VI, Characterization
The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I IV that a large number of technical and applicational aspect...
Gorde:
| Beste egile batzuk: | , |
|---|---|
| Formatua: | Livre numérique |
| Hizkuntza: | Anglais |
| Argitaratua: |
Berlin, Heidelberg :
Springer Berlin Heidelberg : Springer e-books
[20..].
Cham : Springer Nature |
| Saila: | NanoScience and Technology
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| Sarrera elektronikoa: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Oharra: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Applied scanning probe methods, VI, Characterization, Bharat Bhushan, Satoshi Kawata (eds.), Berlin, Springer, 2007, 1 vol. (XLV- 338 p.), Nanoscience and technology, 3-540-37318-7 |