Applied scanning probe methods. III, Characterization
The Nobel Prize of 1986 on Sc- ning Tunneling Microscopy sig- led a new era in imaging. The sc- ning probes emerged as a new i- trument for imaging with a pre- sion suf?cient to delineate single atoms. At ?rst there were two the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope,...
Enregistré dans:
| Auteur principal: | |
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| Autres auteurs: | |
| Format: | Livre numérique |
| Langue: | Anglais |
| Publié: |
Berlin, Heidelberg :
Springer Berlin Heidelberg
[20..].
Cham : Springer Nature |
| Édition: | 1st ed. 2006. |
| Collection: | NanoScience and Technology
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| Accès en ligne: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Note: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Applied scanning probe methods III, characterization, edited by Bharat Bhushan, Harald Fuchs, Berlin, Springer, 2006, 1 vol. (XLIII-378 p.), Nanoscience and technology, 3-540-26909-6 • Applied Scanning Probe Methods III, Texte imprimé, 9783642065965 • Applied Scanning Probe Methods III, Texte imprimé, 9783540812654 |
Table des matières:
- Atomic Force Microscopy in Nanomedicine Scanning Probe Microscopy: From Living Cells to the Subatomic Range Surface Characterization and Adhesion and Friction Properties of Hydrophobic Leaf Surfaces and Nanopatterned Polymers for Superhydrophobic Surfaces Probing Macromolecular Dynamics and the Influence of Finite Size Effects Investigation of Organic Supramolecules by Scanning Probe Microscopy in Ultra-High Vacuum One- and Two-Dimensional Systems: Scanning Tunneling Microscopy and Spectroscopy of Organic and Inorganic Structures Scanning Probe Microscopy Applied to Ferroelectric Materials Morphological and Tribological Characterization of Rough Surfaces by Atomic Force Microscopy AFM Applications for Contact and Wear Simulation AFM Applications for Analysis of Fullerene-Like Nanoparticles Scanning Probe Methods in the Magnetic Tape Industry