Scanning probe microscopy in nanoscience and nanotechnology. 3
This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various mater...
Enregistré dans:
| Auteur principal: | |
|---|---|
| Format: | Livre numérique |
| Langue: | Anglais |
| Publié: |
Berlin, Heidelberg :
Springer Berlin Heidelberg
[20..].
Cham : Springer Nature |
| Édition: | 1st ed. 2013. |
| Collection: | NanoScience and Technology
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| Accès en ligne: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Note: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Scanning Probe Microscopy in Nanoscience and Nanotechnology 3, Texte imprimé, 9783642254154 • Scanning probe microscopy in nanoscience and nanotechnology, 3, Bharat Bhushan, editor, Berlin, Springer-Verlag, 2013, 1 vol. (XX-630 p.), Nanoscience and technology, 978-3-642-25413-0 • Scanning Probe Microscopy in Nanoscience and Nanotechnology 3, Texte imprimé, 9783662507254 |
Table des matières:
- Part 1: Scanning probe microscopy techniques- Spectroscopic techniques in SPM- High speed AFM imaging New developments in imaging of biological samples New developments in AFM SNOM Part 2: Nanocharacterization Antibodies for protein recognition In-situ imaging of living cells In-situ crystallization of wax materials Part 3: Biomimetics and industrial applications Electrowetting and switchable hydrophobicity Renewable energy applications AFMs in hard disk industry