Scanning probe microscopy in nanoscience and nanotechnology. 3
This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various mater...
محفوظ في:
| المؤلف الرئيسي: | |
|---|---|
| التنسيق: | Livre numérique |
| اللغة: | Anglais |
| منشور في: |
Berlin, Heidelberg :
Springer Berlin Heidelberg
[20..].
Cham : Springer Nature |
| الطبعة: | 1st ed. 2013. |
| سلاسل: | NanoScience and Technology
|
| الوصول للمادة أونلاين: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| ملاحظة: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Scanning Probe Microscopy in Nanoscience and Nanotechnology 3, Texte imprimé, 9783642254154 • Scanning probe microscopy in nanoscience and nanotechnology, 3, Bharat Bhushan, editor, Berlin, Springer-Verlag, 2013, 1 vol. (XX-630 p.), Nanoscience and technology, 978-3-642-25413-0 • Scanning Probe Microscopy in Nanoscience and Nanotechnology 3, Texte imprimé, 9783662507254 |