Nanometer Variation-Tolerant SRAM : Circuits and Statistical Design for Yield
Variability is one of the most challenging obstacles for IC design in the nanometer regime. In nanometer technologies, SRAM show an increased sensitivity to process variations due to low-voltage operation requirements, which are aggravated by the strong demand for lower power consumption and cost,...
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| Autors principals: | , |
|---|---|
| Format: | Livre numérique |
| Idioma: | Anglais |
| Publicat: |
New York, NY :
Springer New York
2013.
Cham : Springer Nature |
| Accés en línia: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Nota: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Nanometer Variation-Tolerant SRAM, Texte imprimé, 9781461417484 • Nanometer Variation-Tolerant SRAM, Texte imprimé, 9781461417507 • Nanometer Variation-Tolerant SRAM, Texte imprimé, 9781493902200 |
| LEADER | 03546nam a22003497a 4500 | ||
|---|---|---|---|
| 001 | 949589 | ||
| 008 | 130325s2013 xx ||| |||| 00| 0 eng d | ||
| 009 | PPN168295490 | ||
| 020 | |a 9781461417491 | ||
| 020 | |a 9781461417491 | ||
| 041 | 0 | |a eng | |
| 082 | |a 621.3815 | ||
| 100 | 1 | |a Abu-Rahma, Mohamed H. | |
| 245 | 1 | 0 | |a Nanometer Variation-Tolerant SRAM : |b Circuits and Statistical Design for Yield |c by Mohamed H. Abu-Rahma, Mohab Anis. |
| 260 | |a New York, NY : |b Springer New York. | ||
| 260 | |a Cham : |b Springer Nature, |c 2013. | ||
| 500 | |a Archives Springer e-books (Licence nationale) | ||
| 500 | |a Archives Springer e-books (Licence nationale) | ||
| 505 | 0 | |a Introduction -- Variability in Nanometer Technologies and Impact on SRAM -- Variarion-Tolerant SRAM Write and Read Assist Techniques -- Reducing SRAM Power using Fine-Grained Wordline Pulse Width Control -- A Methodology for Statistical Estimation of Read Access Yield in SRAMs -- Characterization of SRAM Sense Amplifier Input Offset for Yield Prediction. | |
| 506 | |a Accès en ligne pour les établissements français bénéficiaires des licences nationales | ||
| 506 | |a Accès soumis à abonnement pour tout autre établissement | ||
| 506 | |a Conditions particulières de réutilisation pour les bénéficiaires des licences nationales. chttps://www.licencesnationales.fr/springer-nature-ebooks-contrat-licence-ln-2017 | ||
| 520 | |a Variability is one of the most challenging obstacles for IC design in the nanometer regime. In nanometer technologies, SRAM show an increased sensitivity to process variations due to low-voltage operation requirements, which are aggravated by the strong demand for lower power consumption and cost, while achieving higher performance and density. With the drastic increase in memory densities, lower supply voltages, and higher variations, statistical simulation methodologies become imperative to estimate memory yield and optimize performance and power. This book is an invaluable reference on robust SRAM circuits and statistical design methodologies for researchers and practicing engineers in the field of memory design. It combines state of the art circuit techniques and statistical methodologies to optimize SRAM performance and yield in nanometer technologies. Provides comprehensive review of state-of-the-art, variation-tolerant SRAM circuit techniques; Discusses Impact of device related process variations and how they affect circuit and system performance, from a design point of view; Helps designers optimize memory yield, with practical statistical design methodologies and yield estimation techniques. | ||
| 700 | 1 | |a Anis, Mohab. |4 aut | |
| 776 | 0 | |t Nanometer Variation-Tolerant SRAM |b Texte imprimé |z 9781461417484 | |
| 776 | 0 | |t Nanometer Variation-Tolerant SRAM |b Texte imprimé |z 9781461417507 | |
| 776 | 0 | |t Nanometer Variation-Tolerant SRAM |b Texte imprimé |z 9781493902200 | |
| 856 | 4 | |q PDF |u https://doi.org/10.1007/978-1-4614-1749-1 |z Accès sur la plateforme de l'éditeur | |
| 856 | 4 | |u https://revue-sommaire.istex.fr/ark:/67375/8Q1-GH87MNS5-W |z Accès sur la plateforme Istex | |
| 856 | 4 | |5 452349901:748120327 |u https://ezproxy.univ-orleans.fr/login?url=https://doi.org/10.1007/978-1-4614-1749-1 |z Accès Université d'Orléans | |
| 856 | 4 | |5 180339901:751574899 |u https://ezproxy.insa-cvl.fr/login?qurl=https://doi.org/10.1007/978-1-4614-1749-1 |z Accès INSA CVL | |
| 997 | |0 949589 |1 Livre numérique |a Ressource numérique |b INSA |b ENSA |c 0/Bibliothèque numérique/ |c 1/Bibliothèque numérique/Autre ressource numérique/ | ||