Robust SRAM Designs and Analysis
This book provides a guide to Static Random Access Memory (SRAM) bitcell design and analysis to meet the nano-regime challenges for CMOS devices and emerging devices, such as Tunnel FETs. Since process variability is an ongoing challenge in large memory arrays, this book highlights the most popular...
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| Autors principals: | , , |
|---|---|
| Format: | Livre numérique |
| Idioma: | Anglais |
| Publicat: |
New York, NY :
Springer New York
2013.
Cham : Springer Nature |
| Accés en línia: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Nota: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Robust SRAM Designs and Analysis, Texte imprimé, 9781461408178 • Robust SRAM Designs and Analysis, Texte imprimé, 9781461408192 • Robust SRAM Designs and Analysis, Texte imprimé, 9781493902446 |
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| 008 | 130325s2013 xx ||| |||| 00| 0 eng d | ||
| 009 | PPN168294915 | ||
| 020 | |a 9781461408185 | ||
| 020 | |a 9781461408185 | ||
| 041 | 0 | |a eng | |
| 082 | |a 621.3815 | ||
| 100 | 1 | |a Singh, Jawar. | |
| 245 | 1 | 0 | |a Robust SRAM Designs and Analysis |c by Jawar Singh, Saraju P. Mohanty, Dhiraj K. Pradhan. |
| 260 | |a New York, NY : |b Springer New York. | ||
| 260 | |a Cham : |b Springer Nature, |c 2013. | ||
| 500 | |a Archives Springer e-books (Licence nationale) | ||
| 500 | |a Archives Springer e-books (Licence nationale) | ||
| 505 | 0 | |a Introduction to SRAM -- Design Metrics of SRAM Bitcell -- Single-ended SRAM Bitcell Design -- 2-Port SRAM Bitcell Design -- SRAM Bitcell Design Using Unidirectional Devices -- NBTI and its Effect on SRAM. | |
| 506 | |a Accès en ligne pour les établissements français bénéficiaires des licences nationales | ||
| 506 | |a Accès soumis à abonnement pour tout autre établissement | ||
| 506 | |a Conditions particulières de réutilisation pour les bénéficiaires des licences nationales. chttps://www.licencesnationales.fr/springer-nature-ebooks-contrat-licence-ln-2017 | ||
| 520 | |a This book provides a guide to Static Random Access Memory (SRAM) bitcell design and analysis to meet the nano-regime challenges for CMOS devices and emerging devices, such as Tunnel FETs. Since process variability is an ongoing challenge in large memory arrays, this book highlights the most popular SRAM bitcell topologies (benchmark circuits) that mitigate variability, along with exhaustive analysis. Experimental simulation setups are also included, which cover nano-regime challenges such as process variation, leakage and NBTI for SRAM design and analysis. Emphasis is placed throughout the book on the various trade-offs for achieving a best SRAM bitcell design. Provides a complete and concise introduction to SRAM bitcell design and analysis; Offers techniques to face nano-regime challenges such as process variation, leakage and NBTI for SRAM design and analysis; Includes simulation set-ups for extracting different design metrics for CMOS technology and emerging devices; Emphasizes different trade-offs for achieving the best possible SRAM bitcell design. | ||
| 700 | 1 | |a Mohanty, Saraju P. |4 aut | |
| 700 | 1 | |a Pradhan, Dhiraj K. |4 aut | |
| 776 | 0 | |t Robust SRAM Designs and Analysis |b Texte imprimé |z 9781461408178 | |
| 776 | 0 | |t Robust SRAM Designs and Analysis |b Texte imprimé |z 9781461408192 | |
| 776 | 0 | |t Robust SRAM Designs and Analysis |b Texte imprimé |z 9781493902446 | |
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| 997 | |0 949574 |1 Livre numérique |a Ressource numérique |b INSA |b ENSA |c 0/Bibliothèque numérique/ |c 1/Bibliothèque numérique/Autre ressource numérique/ | ||