Efficient test methodologies for high-speed serial links
With the increasing demand for higher data bandwidth, communication systems data rates have reached the multi-gigahertz range and even beyond. Advances in semiconductor technologies have accelerated the adoption of high-speed serial interfaces, such as PCI-Express, Serial-ATA, and XAUI, in order to...
Salvato in:
| Autori principali: | , |
|---|---|
| Natura: | Livre numérique |
| Lingua: | Anglais |
| Pubblicazione: |
Dordrecht :
Springer Netherlands
[20..].
Cham : Springer Nature |
| Edizione: | 1st ed. 2010. |
| Serie: | Lecture Notes in Electrical Engineering
51 |
| Accesso online: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Nota: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Efficient Test Methodologies for High-Speed Serial Links, Texte imprimé, 9789048134427 |
Sommario:
- An Efficient Jitter Measurement Technique BER Estimation for Linear Clock and Data Recovery Circuit BER Estimation for Non-linear Clock and Data Recovery Circuit Gaps in Timing Margining Test An Accurate Jitter Estimation Technique A Two-Tone Test Method for Continuous-Time Adaptive Equalizers Conclusions