Accelerating test, validation and debug of high speed serial interfaces
High-Speed Serial Interface (HSSI) devices have become widespread in communications, from the embedded to high-performance computing systems, and from on-chip to a wide haul. Testing of HSSIs has been a challenging topic because of signal integrity issues, long test time and the need of expensive in...
Gardado en:
| Auteurs principaux: | , |
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| Formato: | Livre numérique |
| Idioma: | Anglais |
| Publicado: |
Dordrecht :
Springer Netherlands
2011.
Cham : Springer Nature |
| Acceso en liña: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Nota: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Accelerating Test, Validation and Debug of High Speed Serial Interfaces, Texte imprimé, 9789048193974 • Accelerating Test, Validation and Debug of High Speed Serial Interfaces, Texte imprimé, 9789048193998 • Accelerating Test, Validation and Debug of High Speed Serial Interfaces, Texte imprimé, 9789400789739 |