Nanometer technology designs high-quality delay tests

While adopting newer, better fabrication technologies provides higher integration and enhances performance, it also increases the types of manufacturing defects. With design size in millions of gates and working frequency in GHz, timing-related defects have become a high proportion of the total chip...

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Autori principali: Tehranipoor, Mark, 1974-, Ahmed, Nisar (Autore)
Natura: Livre numérique
Lingua:Anglais
Pubblicazione: New York, NY : Springer US 2008.
Cham : Springer Nature
Accesso online:Accès sur la plateforme de l'éditeur
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Accès Université d'Orléans
Accès INSA CVL
Nota: Archives Springer e-books (Licence nationale)
Archives Springer e-books (Licence nationale)
Autres localisations: Voir dans le Sudoc
Edition sous un autre format:• Nanometer Technology Designs, Texte imprimé, 9780387764863
• Perspectives for parallel optical interconnects, Ph. Lalanne, P. Chavel (eds.), Berlin, Springer-Verlag, 1993, 1 volume, ESPRIT basic research series, 3-540-56786-0
• Nanometer Technology Designs, Texte imprimé, 9781441945594

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