Nanometer technology designs high-quality delay tests
While adopting newer, better fabrication technologies provides higher integration and enhances performance, it also increases the types of manufacturing defects. With design size in millions of gates and working frequency in GHz, timing-related defects have become a high proportion of the total chip...
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| Autori principali: | Tehranipoor, Mark, 1974-, Ahmed, Nisar (Autore) |
|---|---|
| Natura: | Livre numérique |
| Lingua: | Anglais |
| Pubblicazione: |
New York, NY :
Springer US
2008.
Cham : Springer Nature |
| Accesso online: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Nota: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Nanometer Technology Designs, Texte imprimé, 9780387764863 • Perspectives for parallel optical interconnects, Ph. Lalanne, P. Chavel (eds.), Berlin, Springer-Verlag, 1993, 1 volume, ESPRIT basic research series, 3-540-56786-0 • Nanometer Technology Designs, Texte imprimé, 9781441945594 |
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