Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs
Since process variation and chip performance uncertainties have become more pronounced as technologies scale down into the nanometer regime, accurate and efficient modeling or characterization of variations from the device to the architecture level have become imperative for the successful design o...
সংরক্ষণ করুন:
| প্রধান লেখক: | , , |
|---|---|
| বিন্যাস: | Livre numérique |
| ভাষা: | Anglais |
| প্রকাশিত: |
New York, NY :
Springer New York
2012.
Cham : Springer Nature |
| অনলাইন ব্যবহার করুন: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| টীকা: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs, Texte imprimé, 9781461407874 • Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs, Texte imprimé, 9781461407898 • Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs, Texte imprimé, 9781489987877 |