Nanometer technology designs high-quality delay tests
While adopting newer, better fabrication technologies provides higher integration and enhances performance, it also increases the types of manufacturing defects. With design size in millions of gates and working frequency in GHz, timing-related defects have become a high proportion of the total chip...
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| Glavni autori: | , |
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| Format: | Livre numérique |
| Jezik: | Anglais |
| Izdano: |
New York, NY :
Springer US
2008.
Cham : Springer Nature |
| Online pristup: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Bilješka: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Nanometer Technology Designs, Texte imprimé, 9780387764863 • Perspectives for parallel optical interconnects, Ph. Lalanne, P. Chavel (eds.), Berlin, Springer-Verlag, 1993, 1 volume, ESPRIT basic research series, 3-540-56786-0 • Nanometer Technology Designs, Texte imprimé, 9781441945594 |
| Sažetak: | While adopting newer, better fabrication technologies provides higher integration and enhances performance, it also increases the types of manufacturing defects. With design size in millions of gates and working frequency in GHz, timing-related defects have become a high proportion of the total chip defects. For nanometer technology designs, the traditional test methods cannot ensure a high quality level of chips, and at-speed tests using path and transition delay fault model have become a requirement in technologies below 180nm. Nanometer Technology Designs: High-Quality Delay Tests discusses these challenges in detail and proposes new techniques and methodologies to improve the overall quality of the delay test for nanotechnology designs. Topics covered include: At-speed test challenges for nanotechnology Low-cost tester-friendly design-for-test techniques Improving test quality of current at-speed test methods Functionally un-testable fault list generation and avoidance Timing-based ATPG for screening small delay faults Faster-than-at-speed test considering power supply noise Power supply noise tolerant at-speed test pattern generation and application Solutions for dealing with crosstalk and signal integrity issues Nanometer Technology Designs: High-Quality Delay Tests is a reference for practicing engineers and researchers in both industry and academia who are interested in learning about and implementing the most-advanced methods in nanometer delay testing. |
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| Opis djela: | Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| ISBN: | 9780387757285 |
| Pristup: | Accès en ligne pour les établissements français bénéficiaires des licences nationales Accès soumis à abonnement pour tout autre établissement Conditions particulières de réutilisation pour les bénéficiaires des licences nationales. chttps://www.licencesnationales.fr/springer-nature-ebooks-contrat-licence-ln-2017 |