Extreme statistics in sanoscale memory design
Extreme Statistics in Nanoscale Memory Design brings together some of the world s leading experts in statistical EDA, memory design, device variability modeling and reliability modeling, to compile theoretical and practical results in one complete reference on statistical techniques for extreme stat...
Guardat en:
| Autors principals: | , |
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| Altres autors: | , |
| Format: | Livre numérique |
| Idioma: | Anglais |
| Publicat: |
New York, NY :
Springer US
[20..].
Cham : Springer Nature |
| Edició: | 1. |
| Col·lecció: | Integrated Circuits and Systems
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| Accés en línia: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Nota: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Extreme Statistics in Nanoscale Memory Design, Texte imprimé, 9781461426721 • Extreme Statistics in Nanoscale Memory Design, Texte imprimé, 9781441966056 • Extreme Statistics in Nanoscale Memory Design, Texte imprimé, 9781441966070 • Extreme Statistics in Nanoscale Memory Design, Texte imprimé, 9781461426721 • Extreme Statistics in Nanoscale Memory Design, Texte imprimé, 9781441966056 • Extreme Statistics in Nanoscale Memory Design, Texte imprimé, 9781441966070 • Extreme Statistics in Nanoscale Memory Design, Texte imprimé, 9781461426721 • Extreme Statistics in Nanoscale Memory Design, Texte imprimé, 9781441966056 • Extreme Statistics in Nanoscale Memory Design, Texte imprimé, 9781441966070 |
Taula de continguts:
- Extreme Statistics in Memories Statistical Nano CMOS Variability and Its Impact on SRAM Importance Sampling-Based Estimation: Applications to Memory Design Direct SRAM Operation Margin Computation with Random Skews of Device Characteristics Yield Estimation by Computing Probabilistic Hypervolumes Most Probable Point-Based Methods Extreme Value Theory: Application to Memory Statistics.