Extreme statistics in sanoscale memory design
Extreme Statistics in Nanoscale Memory Design brings together some of the world s leading experts in statistical EDA, memory design, device variability modeling and reliability modeling, to compile theoretical and practical results in one complete reference on statistical techniques for extreme stat...
Enregistré dans:
| Auteurs principaux: | , |
|---|---|
| Andre forfattere: | , |
| Format: | Livre numérique |
| Sprog: | Anglais |
| Udgivet: |
New York, NY :
Springer US
[20..].
Cham : Springer Nature |
| Udgivelse: | 1. |
| Serier: | Integrated Circuits and Systems
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| Online adgang: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Kommentar: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Extreme Statistics in Nanoscale Memory Design, Texte imprimé, 9781461426721 • Extreme Statistics in Nanoscale Memory Design, Texte imprimé, 9781441966056 • Extreme Statistics in Nanoscale Memory Design, Texte imprimé, 9781441966070 • Extreme Statistics in Nanoscale Memory Design, Texte imprimé, 9781461426721 • Extreme Statistics in Nanoscale Memory Design, Texte imprimé, 9781441966056 • Extreme Statistics in Nanoscale Memory Design, Texte imprimé, 9781441966070 • Extreme Statistics in Nanoscale Memory Design, Texte imprimé, 9781461426721 • Extreme Statistics in Nanoscale Memory Design, Texte imprimé, 9781441966056 • Extreme Statistics in Nanoscale Memory Design, Texte imprimé, 9781441966070 |