Novel algorithms for fast statistical analysis of scaled circuits
As VLSI technology moves to the nanometer scale for transistor feature sizes, the impact of manufacturing imperfections result in large variations in the circuit performance. Traditional CAD tools are not well-equipped to handle this scenario, since they do not model this statistical nature of the c...
Enregistré dans:
| Auteurs principaux: | , |
|---|---|
| Format: | Livre numérique |
| Langue: | Anglais |
| Publié: |
Dordrecht :
Springer Netherlands
2009.
Cham : Springer Nature |
| Collection: | Lecture Notes in Electrical Engineering
46 |
| Accès en ligne: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Note: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Novel Algorithms for Fast Statistical Analysis of Scaled Circuits, Texte imprimé, 9789048130993 • Novel Algorithms for Fast Statistical Analysis of Scaled Circuits, Texte imprimé, 9789048131013 • Novel Algorithms for Fast Statistical Analysis of Scaled Circuits, Texte imprimé, 9789400736870 |