Extreme statistics in sanoscale memory design
Extreme Statistics in Nanoscale Memory Design brings together some of the world s leading experts in statistical EDA, memory design, device variability modeling and reliability modeling, to compile theoretical and practical results in one complete reference on statistical techniques for extreme stat...
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| Auteurs principaux: | , |
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| Outros Autores: | , |
| Formato: | Livre numérique |
| Idioma: | Anglais |
| Publicado em: |
New York, NY :
Springer US
[20..].
Cham : Springer Nature |
| Edição: | 1. |
| Colecção: | Integrated Circuits and Systems
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| Acesso em linha: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Nota: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Extreme Statistics in Nanoscale Memory Design, Texte imprimé, 9781461426721 • Extreme Statistics in Nanoscale Memory Design, Texte imprimé, 9781441966056 • Extreme Statistics in Nanoscale Memory Design, Texte imprimé, 9781441966070 • Extreme Statistics in Nanoscale Memory Design, Texte imprimé, 9781461426721 • Extreme Statistics in Nanoscale Memory Design, Texte imprimé, 9781441966056 • Extreme Statistics in Nanoscale Memory Design, Texte imprimé, 9781441966070 • Extreme Statistics in Nanoscale Memory Design, Texte imprimé, 9781461426721 • Extreme Statistics in Nanoscale Memory Design, Texte imprimé, 9781441966056 • Extreme Statistics in Nanoscale Memory Design, Texte imprimé, 9781441966070 |
| Resumo: | Extreme Statistics in Nanoscale Memory Design brings together some of the world s leading experts in statistical EDA, memory design, device variability modeling and reliability modeling, to compile theoretical and practical results in one complete reference on statistical techniques for extreme statistics in nanoscale memories. The work covers a variety of techniques, including statistical, deterministic, model-based and non-parametric methods, along with relevant description of the sources of variations and their impact on devices and memory design. Specifically, the authors cover methods from extreme value theory, Monte Carlo simulation, reliability modeling, direct memory margin computation and hypervolume computation. Ideas are also presented both from the perspective of an EDA practitioner and a memory designer to provide a comprehensive understanding of the state-of -the-art in the area of extreme statistics estimation and statistical memory design. Extreme Statistics in Nanoscale Memory Design is a useful reference on statistical design of integrated circuits for researchers, engineers and professionals. |
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| Descrição do item: | Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| ISBN: | 9781441966063 |
| ISSN: | 1558-9420 |
| Acesso: | Accès en ligne pour les établissements français bénéficiaires des licences nationales Accès soumis à abonnement pour tout autre établissement Conditions particulières de réutilisation pour les bénéficiaires des licences nationales. https://www.licencesnationales.fr/springer-nature-ebooks-contrat-licence-ln-2017 |