Novel algorithms for fast statistical analysis of scaled circuits :: SCD d'Orléans

Novel algorithms for fast statistical analysis of scaled circuits

Novel algorithms for fast statistical analysis of scaled circuits

As VLSI technology moves to the nanometer scale for transistor feature sizes, the impact of manufacturing imperfections result in large variations in the circuit performance. Traditional CAD tools are not well-equipped to handle this scenario, since they do not model this statistical nature of the c...

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Bibliografiske detaljer
Auteurs principaux:	Singhee, Amith, 19..-, Rutenbar, Rob A., 1957- (Auteur)
Format:	Livre numérique
Sprog:	Anglais
Udgivet:	Dordrecht : Springer Netherlands 2009. Cham : Springer Nature
Serier:	Lecture Notes in Electrical Engineering 46
Online adgang:	Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL
Kommentar:	Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale)
Autres localisations:	Voir dans le Sudoc
Edition sous un autre format:	• Novel Algorithms for Fast Statistical Analysis of Scaled Circuits, Texte imprimé, 9789048130993 • Novel Algorithms for Fast Statistical Analysis of Scaled Circuits, Texte imprimé, 9789048131013 • Novel Algorithms for Fast Statistical Analysis of Scaled Circuits, Texte imprimé, 9789400736870

Lignende værker

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Stochastic Models, Statistical Methods, and Algorithms in Image Analysis : Proceedings of the Special Year on Image Analysis, held in Rome, Italy, 1990

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Circuit Analysis
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Analyse de circuits : introduction
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Statistical analysis of Al 
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Introduction to statistical analysis
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Statistical analysis : ideas and methodes
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Introductory circuit analysis
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Engineering circuit analysis
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Circuit Analysis for Dummies
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Novel algorithms and techniques In telecommunications, automation and industrial electronics

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