Applied scanning probe methods. XI, Scanning probe microscopy techniques
The ability to accurately and reproducibly measure the properties and perf- mance characteristics of nanoscale materials, devices, and systems is a critical enabler for progress in fundamental nanoscience, in the design of new nanoma- rials, and ultimately in manufacturing new nanoscale products [1]...
Kaydedildi:
| Yazar: | |
|---|---|
| Diğer Yazarlar: | |
| Materyal Türü: | Livre numérique |
| Dil: | Anglais |
| Baskı/Yayın Bilgisi: |
Berlin, Heidelberg :
Springer Berlin Heidelberg
[20..].
Cham : Springer Nature |
| Edisyon: | 1st ed. 2009. |
| Seri Bilgileri: | NanoScience and Technology
|
| Online Erişim: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Not: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Applied scanning probe methods XI, scanning probe microscopy techniques, [edited by] Bharat Bhushan, Harald Fuchs, Berlin, Springer, 2009, 1 vol. (LV-235 p.), Nanoscience and technology, 978-3-540-85036-6 • Applied Scanning Probe Methods XI, Texte imprimé, 9783540873013 • Applied Scanning Probe Methods XI, Texte imprimé, 9783642098697 |