Applied scanning probe methods. XI, Scanning probe microscopy techniques
The ability to accurately and reproducibly measure the properties and perf- mance characteristics of nanoscale materials, devices, and systems is a critical enabler for progress in fundamental nanoscience, in the design of new nanoma- rials, and ultimately in manufacturing new nanoscale products [1]...
Guardat en:
| Autor principal: | |
|---|---|
| Altres autors: | |
| Format: | Livre numérique |
| Idioma: | Anglais |
| Publicat: |
Berlin, Heidelberg :
Springer Berlin Heidelberg
[20..].
Cham : Springer Nature |
| Edició: | 1st ed. 2009. |
| Col·lecció: | NanoScience and Technology
|
| Accés en línia: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Nota: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Applied scanning probe methods XI, scanning probe microscopy techniques, [edited by] Bharat Bhushan, Harald Fuchs, Berlin, Springer, 2009, 1 vol. (LV-235 p.), Nanoscience and technology, 978-3-540-85036-6 • Applied Scanning Probe Methods XI, Texte imprimé, 9783540873013 • Applied Scanning Probe Methods XI, Texte imprimé, 9783642098697 |
| LEADER | 04570nam a22003617a 4500 | ||
|---|---|---|---|
| 001 | 940988 | ||
| 008 | 090210q2000 xx ||| |||| 00| 0 eng d | ||
| 009 | PPN131119109 | ||
| 020 | |a 9783540850373 | ||
| 041 | 0 | |a eng | |
| 082 | |a 620.5 | ||
| 100 | 1 | |a Bhushan, Bharat. | |
| 245 | 1 | 0 | |a Applied scanning probe methods. |n XI, |p Scanning probe microscopy techniques |c by Bharat Bhushan, Harald Fuchs ; edited by Phaedon Avouris, Bharat Bhushan, Dieter Bimberg, Klaus von Klitzing, Hiroyuki Sakaki, Roland Wiesendanger. |
| 250 | |a 1st ed. 2009. | ||
| 260 | |a Berlin, Heidelberg : |b Springer Berlin Heidelberg. | ||
| 260 | |a Cham : |b Springer Nature, |c [20..]. | ||
| 490 | 0 | |a NanoScience and Technology |x 2197-7127 | |
| 500 | |a Archives Springer e-books (Licence nationale) | ||
| 500 | |a Archives Springer e-books (Licence nationale) | ||
| 505 | 1 | |a Oscillation Control in Dynamic SPM with Quartz Sensors Atomic Force Microscope Cantilevers Used as Sensors for Monitoring Microdrop Evaporation Mechanical Diode-Based Ultrasonic Atomic Force Microscopies Contact Atomic Force Microscopy: A Powerful Tool in Adhesion Science Contact Resonance Force Microscopy Techniques for Nanomechanical Measurements AFM Nanoindentation Method: Geometrical Effects of the Indenter Tip Local Mechanical Properties by Atomic Force Microscopy Nanoindentations Thermal Activation Effects in Dynamic Force Spectroscopy and Atomic Friction | |
| 506 | |a Accès en ligne pour les établissements français bénéficiaires des licences nationales | ||
| 506 | |a Accès soumis à abonnement pour tout autre établissement | ||
| 506 | |a Conditions particulières de réutilisation pour les bénéficiaires des licences nationales. https://www.licencesnationales.fr/springer-nature-ebooks-contrat-licence-ln-2017 | ||
| 520 | |a The ability to accurately and reproducibly measure the properties and perf- mance characteristics of nanoscale materials, devices, and systems is a critical enabler for progress in fundamental nanoscience, in the design of new nanoma- rials, and ultimately in manufacturing new nanoscale products [1]. This quotation from the US National Nanotechnology Initiative emphasizes the need for measu- ment tools in emerging nanomaterial applications, a eld predicted to generate a multibillion-dollar market within 10 years. One speci c measurement need is for nanomechanical information knowledge on the nanoscale of mechanical prop- ties such as elastic modulus, adhesion, and friction. Accurate information is essential not only to predict the performance of a system before use, but also to evaluate its reliability during or after use. The measurement need is motivated partly by the fact that new applications often involve structures with nanoscale dimensions (e. g. , nanoelectromechanical systems, nanoimprint lithography). Measurements of such structures by necessity must provide nanoscale spatial resolution. Other new structures have larger overall dimensions, but integrate disparate materials on the micro- or nanoscale (e. g. , electronic interconnect, nanocomposites). In such cases, nanoscale information is needed in order to differentiate the properties of the various components. Many methods to measure small-scale mechanical properties have been devised, including ones based on indentation [2 4], on ultrasonics [5,6], and on other phy- cal phenomena [7,8]. Such methods often have drawbacks: they are not suf ciently quantitative, are limited to specialized geometries, and so forth | ||
| 700 | 1 | |a Fuchs, Harald. |4 pbd | |
| 776 | 0 | |0 137835817 |t Applied scanning probe methods XI |o scanning probe microscopy techniques |f [edited by] Bharat Bhushan, Harald Fuchs |c Berlin |n Springer |d 2009 |p 1 vol. (LV-235 p.) |s Nanoscience and technology |z 978-3-540-85036-6 | |
| 776 | 0 | |t Applied Scanning Probe Methods XI |b Texte imprimé |z 9783540873013 | |
| 776 | 0 | |t Applied Scanning Probe Methods XI |b Texte imprimé |z 9783642098697 | |
| 856 | 4 | |q PDF |u https://doi.org/10.1007/978-3-540-85037-3 |z Accès sur la plateforme de l'éditeur | |
| 856 | 4 | |u https://revue-sommaire.istex.fr/ark:/67375/8Q1-JV3G2KWR-G |z Accès sur la plateforme Istex | |
| 856 | 4 | |5 452349901:747851670 |u https://ezproxy.univ-orleans.fr/login?url=https://dx.doi.org/10.1007/978-3-540-85037-3 |z Accès Université d'Orléans | |
| 856 | 4 | |5 180339901:750869313 |u https://ezproxy.insa-cvl.fr/login?qurl=https://dx.doi.org/10.1007/978-3-540-85037-3 |z Accès INSA CVL | |
| 997 | |0 940988 |1 Livre numérique |a Ressource numérique |b INSA |b ENSA |c 0/Bibliothèque numérique/ |c 1/Bibliothèque numérique/Autre ressource numérique/ | ||