Applied scanning probe methods. VIII, Scanning probe microscopy techniques
The success of the Springer Series Applied Scanning Probe Methods I VII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural step to collect further speci c results in the elds of development of scanning probe microscopy techniques (Vol. VII...
Salvato in:
| Autore principale: | |
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| Altri autori: | , |
| Natura: | Livre numérique |
| Lingua: | Anglais |
| Pubblicazione: |
Berlin, Heidelberg :
Springer Berlin Heidelberg
[20..].
Cham : Springer Nature |
| Edizione: | 1st ed. 2008. |
| Serie: | NanoScience and Technology
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| Accesso online: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Nota: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Applied scanning probe methods VIII, scanning probe microscopy techniques, [edited by] Bharat Bhushan, Harald Fuchs, Masahiko Tomitori, Berlin, Springer, 2008, 1 vol. (lix-465 p.), Nanoscience and technology, 978-3-540-74079-7 • Applied Scanning Probe Methods VIII, Texte imprimé, 9783642093401 • Applied Scanning Probe Methods VIII, Texte imprimé, 9783540841968 |
Sommario:
- Background-Free Apertureless Near-Field Optical Imaging Critical Dimension Atomic Force Microscopy for Sub-50-nm Microelectronics Technology Nodes Near Field Probes: From Optical Fibers to Optical Nanoantennas Carbon Nanotubes as SPM Tips: Mechanical Properties of Nanotube Tips and Imaging Scanning Probes for the Life Sciences Self-Sensing Cantilever Sensor for Bioscience AFM Sensors in Scanning Electron and Ion Microscopes: Tools for Nanomechanics, Nanoanalytics, and Nanofabrication Cantilever Spring-Constant Calibration in Atomic Force Microscopy Frequency Modulation Atomic Force Microscopy in Liquids Kelvin Probe Force Microscopy: Recent Advances and Applications Application of Scanning Capacitance Microscopy to Analysis at the Nanoscale Probing Electrical Transport Properties at the Nanoscale by Current-Sensing Atomic Force Microscopy