Applied scanning probe methods. V, Scanning probe microscopy techniques
The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I IV that a large number of technical and applicational aspect...
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| Главный автор: | |
|---|---|
| Другие авторы: | , |
| Формат: | Livre numérique |
| Язык: | Anglais |
| Опубликовано: |
Berlin, Heidelberg :
Springer Berlin Heidelberg
[20..].
Cham : Springer Nature |
| Редактирование: | 1st ed. 2007. |
| Серии: | NanoScience and Technology
|
| Online-ссылка: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Примечание: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Applied scanning probe methods, V, Scanning probe microscopy techniques, Bharat Bhushan, Harald Fuchs, Satoshi Kawata (eds.), Berlin, Springer, 2007, 1 vol. (XIV- 344 p.), Nanoscience and technology, 3-540-37315-2 • Applied Scanning Probe Methods V, Texte imprimé, 9783642072116 • Applied Scanning Probe Methods V, Texte imprimé, 9783540827696 |
Оглавление:
- Integrated Cantilevers and Atomic Force Microscopes Electrostatic Microscanner Low-Noise Methods for Optical Measurements of Cantilever Deflections Q-controlled Dynamic Force Microscopy in Air and Liquids High-Frequency Dynamic Force Microscopy Torsional Resonance Microscopy and Its Applications Modeling of Tip-Cantilever Dynamics in Atomic Force Microscopy Combined Scanning Probe Techniques for In-Situ Electrochemical Imaging at a Nanoscale New AFM Developments to Study Elasticity and Adhesion at the Nanoscale Near-Field Raman Spectroscopy and Imaging