Applied scanning probe methods. V, Scanning probe microscopy techniques
The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I IV that a large number of technical and applicational aspect...
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| Hoofdauteur: | |
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| Andere auteurs: | , |
| Formaat: | Livre numérique |
| Taal: | Anglais |
| Gepubliceerd in: |
Berlin, Heidelberg :
Springer Berlin Heidelberg
[20..].
Cham : Springer Nature |
| Editie: | 1st ed. 2007. |
| Reeks: | NanoScience and Technology
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| Online toegang: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
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Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Applied scanning probe methods, V, Scanning probe microscopy techniques, Bharat Bhushan, Harald Fuchs, Satoshi Kawata (eds.), Berlin, Springer, 2007, 1 vol. (XIV- 344 p.), Nanoscience and technology, 3-540-37315-2 • Applied Scanning Probe Methods V, Texte imprimé, 9783642072116 • Applied Scanning Probe Methods V, Texte imprimé, 9783540827696 |
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| 100 | 1 | |a Bhushan, Bharat. | |
| 245 | 1 | 0 | |a Applied scanning probe methods. |n V, |p Scanning probe microscopy techniques |c edited by Bharat Bhushan, Satoshi Kawata, Harald Fuchs. |
| 250 | |a 1st ed. 2007. | ||
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| 490 | 0 | |a NanoScience and Technology |x 2197-7127 | |
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| 505 | 1 | |a Integrated Cantilevers and Atomic Force Microscopes Electrostatic Microscanner Low-Noise Methods for Optical Measurements of Cantilever Deflections Q-controlled Dynamic Force Microscopy in Air and Liquids High-Frequency Dynamic Force Microscopy Torsional Resonance Microscopy and Its Applications Modeling of Tip-Cantilever Dynamics in Atomic Force Microscopy Combined Scanning Probe Techniques for In-Situ Electrochemical Imaging at a Nanoscale New AFM Developments to Study Elasticity and Adhesion at the Nanoscale Near-Field Raman Spectroscopy and Imaging | |
| 506 | |a Accès en ligne pour les établissements français bénéficiaires des licences nationales | ||
| 506 | |a Accès soumis à abonnement pour tout autre établissement | ||
| 506 | |a Conditions particulières de réutilisation pour les bénéficiaires des licences nationales. https://www.licencesnationales.fr/springer-nature-ebooks-contrat-licence-ln-2017 | ||
| 520 | |a The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I IV that a large number of technical and applicational aspects are present and rapidly - veloping worldwide. Considering the success of Vols. I IV and the fact that further colleagues from leading laboratories were ready to contribute their latest achie- ments, we decided to expand the series with articles touching ?elds not covered in the previous volumes. The response and support of our colleagues were excellent, making it possible to edit another three volumes of the series. In contrast to to- cal conference proceedings, the applied scanning probe methods intend to give an overview of recent developments as a compendium for both practical applications and recent basic research results, and novel technical developments with respect to instrumentation and probes. The present volumes cover three main areas: novel probes and techniques (Vol. V), charactarization (Vol. VI), and biomimetics and industrial applications (Vol. VII). Volume V includes an overview of probe and sensor technologies including integrated cantilever concepts, electrostatic microscanners, low-noise methods and improved dynamic force microscopy techniques, high-resonance dynamic force - croscopy and the torsional resonance method, modelling of tip cantilever systems, scanning probe methods, approaches for elasticity and adhesion measurements on the nanometer scale as well as optical applications of scanning probe techniques based on near?eld Raman spectroscopy and imaging | ||
| 700 | 1 | |a Fuchs, Harald. |4 pbd | |
| 700 | 1 | |a Kawata, Satoshi. |4 pbd | |
| 776 | 0 | |0 117763330 |t Applied scanning probe methods |h V |i Scanning probe microscopy techniques |f Bharat Bhushan, Harald Fuchs, Satoshi Kawata (eds.) |c Berlin |n Springer |d 2007 |p 1 vol. (XIV- 344 p.) |s Nanoscience and technology |z 3-540-37315-2 | |
| 776 | 0 | |t Applied Scanning Probe Methods V |b Texte imprimé |z 9783642072116 | |
| 776 | 0 | |t Applied Scanning Probe Methods V |b Texte imprimé |z 9783540827696 | |
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