Applied scanning probe methods. II, Scanning probe microscopy techniques
The Nobel Prize of 1986 on Sc- ningTunnelingMicroscopysignaled a new era in imaging. The sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At ?rst there were two the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or...
Guardat en:
| Autor principal: | |
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| Altres autors: | |
| Format: | Livre numérique |
| Idioma: | Anglais |
| Publicat: |
Berlin, Heidelberg :
Springer Berlin Heidelberg
[20..].
Cham : Springer Nature |
| Edició: | 1st ed. 2006. |
| Col·lecció: | NanoScience and Technology
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| Accés en línia: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Nota: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Applied scanning probe methods II, scanning probe microscopy techniques, edited by Bharat Bhushan, Harald Fuchs, Berlin, Springer, 2006, 1 vol. (XLIII-420 p.), Nanoscience and technology, 3-540-26242-3 • Applied Scanning Probe Methods II, Texte imprimé, 9783642065699 • Applied Scanning Probe Methods II, Texte imprimé, 9783540811947 |
Taula de continguts:
- Higher Harmonics in Dynamic Atomic Force Microscopy Atomic Force Acoustic Microscopy Scanning Ion Conductance Microscopy Spin-Polarized Scanning Tunneling Microscopy Dynamic Force Microscopy and Spectroscopy Sensor Technology for Scanning Probe Microscopy and New Applications Quantitative Nanomechanical Measurements in Biology Scanning Microdeformation Microscopy: Subsurface Imaging and Measurement of Elastic Constants at Mesoscopic Scale Electrostatic Force and Force Gradient Microscopy: Principles, Points of Interest and Application to Characterisation of Semiconductor Materials and Devices Polarization-Modulation Techniques in Near-Field Optical Microscopy for Imaging of Polarization Anisotropy in Photonic Nanostructures Focused Ion Beam as a Scanning Probe: Methods and Applications