High quality test pattern generation and boolean satisfiability
This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). A fast and highly fault efficient SAT-based ATPG framework is presented which is also able to generate high-quality delay t...
Uloženo v:
| Hlavní autoři: | , |
|---|---|
| Médium: | Livre numérique |
| Jazyk: | Anglais |
| Vydáno: |
New York, NY :
Springer New York
2012.
Cham : Springer Nature |
| On-line přístup: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Poznámka: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • High Quality Test Pattern Generation and Boolean Satisfiability, Texte imprimé, 9781441999757 • High Quality Test Pattern Generation and Boolean Satisfiability, Texte imprimé, 9781441999771 • High Quality Test Pattern Generation and Boolean Satisfiability, Texte imprimé, 9781489988478 |
Obsah:
- Part I: Preliminaries and Previous Work
- Circuits and Testing
- Boolean Satisfiability
- ATPG Based on Boolean Satisfiability
- Part II: New SAT Techniques and their Application in ATPG
- Dynamic Clause Activation
- Circuit-based Dynamic Learning
- Part III: High Quality Delay Test Generation
- High Quality ATPG for Transition Faults
- Path Delay Fault Model
- Summary and Outlook.