High quality test pattern generation and boolean satisfiability
This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). A fast and highly fault efficient SAT-based ATPG framework is presented which is also able to generate high-quality delay t...
Na minha lista:
| Principais autores: | , |
|---|---|
| Formato: | Livre numérique |
| Idioma: | Anglais |
| Publicado em: |
New York, NY :
Springer New York
2012.
Cham : Springer Nature |
| Acesso em linha: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Nota: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • High Quality Test Pattern Generation and Boolean Satisfiability, Texte imprimé, 9781441999757 • High Quality Test Pattern Generation and Boolean Satisfiability, Texte imprimé, 9781441999771 • High Quality Test Pattern Generation and Boolean Satisfiability, Texte imprimé, 9781489988478 |