Test pattern generation using boolean proof engines
After producing a chip, the functional correctness of the integrated circuit has to be checked. Otherwise products with malfunctions would be delivered to customers, which is not acceptable for any company. Many algorithms for "Automatic Test Pattern Generation" (ATPG) have been proposed i...
में बचाया:
| मुख्य लेखकों: | , , , |
|---|---|
| स्वरूप: | Livre numérique |
| भाषा: | Anglais |
| प्रकाशित: |
Dordrecht :
Springer Netherlands
2009.
Cham : Springer Nature |
| ऑनलाइन पहुंच: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| टिप्पणी: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Test pattern generation using Boolean proof engines, Rolf Drechsler, Stephan Eggersglüb, Görschwin Fey, Daniel Tille, Dordrecht, Springer, 2009, 1 volume (xii-192 pages), 978-90-481-2359-9 • Test Pattern Generation using Boolean Proof Engines, Texte imprimé, 9789048123735 • Test Pattern Generation using Boolean Proof Engines, Texte imprimé, 9789048184910 |