High quality test pattern generation and boolean satisfiability
This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). A fast and highly fault efficient SAT-based ATPG framework is presented which is also able to generate high-quality delay t...
Salvato in:
| Autori principali: | , |
|---|---|
| Natura: | Livre numérique |
| Lingua: | Anglais |
| Pubblicazione: |
New York, NY :
Springer New York
2012.
Cham : Springer Nature |
| Accesso online: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Nota: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • High Quality Test Pattern Generation and Boolean Satisfiability, Texte imprimé, 9781441999757 • High Quality Test Pattern Generation and Boolean Satisfiability, Texte imprimé, 9781441999771 • High Quality Test Pattern Generation and Boolean Satisfiability, Texte imprimé, 9781489988478 |
| LEADER | 03935nam a22003497a 4500 | ||
|---|---|---|---|
| 001 | 973966 | ||
| 008 | 120309s2012 xx ||| |||| 00| 0 eng d | ||
| 009 | PPN159081068 | ||
| 020 | |a 9781441999764 | ||
| 020 | |a 9781441999764 | ||
| 041 | 0 | |a eng | |
| 082 | |a 621.3815 | ||
| 100 | 1 | |a Eggersglüß, Stephan, |d 19..- | |
| 245 | 1 | 0 | |a High quality test pattern generation and boolean satisfiability |c by Stephan Eggersglüß, Rolf Drechsler. |
| 260 | |a New York, NY : |b Springer New York. | ||
| 260 | |a Cham : |b Springer Nature, |c 2012. | ||
| 500 | |a Archives Springer e-books (Licence nationale) | ||
| 500 | |a Archives Springer e-books (Licence nationale) | ||
| 505 | 0 | |a Part I: Preliminaries and Previous Work -- Circuits and Testing -- Boolean Satisfiability -- ATPG Based on Boolean Satisfiability -- Part II: New SAT Techniques and their Application in ATPG -- Dynamic Clause Activation -- Circuit-based Dynamic Learning -- Part III: High Quality Delay Test Generation -- High Quality ATPG for Transition Faults -- Path Delay Fault Model -- Summary and Outlook. | |
| 506 | |a Accès en ligne pour les établissements français bénéficiaires des licences nationales | ||
| 506 | |a Accès soumis à abonnement pour tout autre établissement | ||
| 506 | |a Conditions particulières de réutilisation pour les bénéficiaires des licences nationales. chttps://www.licencesnationales.fr/springer-nature-ebooks-contrat-licence-ln-2017 | ||
| 520 | |a This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). A fast and highly fault efficient SAT-based ATPG framework is presented which is also able to generate high-quality delay tests such as robust path delay tests, as well as tests with long propagation paths to detect small delay defects. The aim of the techniques and methodologies presented in this book is to improve SAT-based ATPG, in order to make it applicable in industrial practice. Readers will learn to improve the performance and robustness of the overall test generation process, so that the ATPG algorithm reliably will generate test patterns for most targeted faults in acceptable run time to meet the high fault coverage demands of industry. The techniques and improvements presented in this book provide the following advantages: Provides a comprehensive introduction to test generation and Boolean Satisfiability (SAT); Describes a highly fault efficient SAT-based ATPG framework; Introduces circuit-oriented SAT solving techniques, which make use of structural information and are able to accelerate the search process significantly; Provides SAT formulations for the prevalent delay faults models, in addition to the classical stuck-at fault model; Includes an industrial perspective on the state-of-the-art in the testing, along with SAT; two topics typically distinguished from each other. | ||
| 700 | 1 | |a Drechsler, Rolf. |4 aut | |
| 776 | 0 | |t High Quality Test Pattern Generation and Boolean Satisfiability |b Texte imprimé |z 9781441999757 | |
| 776 | 0 | |t High Quality Test Pattern Generation and Boolean Satisfiability |b Texte imprimé |z 9781441999771 | |
| 776 | 0 | |t High Quality Test Pattern Generation and Boolean Satisfiability |b Texte imprimé |z 9781489988478 | |
| 856 | 4 | |q PDF |u https://doi.org/10.1007/978-1-4419-9976-4 |z Accès sur la plateforme de l'éditeur | |
| 856 | 4 | |u https://revue-sommaire.istex.fr/ark:/67375/8Q1-VHGDT8LZ-H |z Accès sur la plateforme Istex | |
| 856 | 4 | |5 452349901:750605766 |u https://ezproxy.univ-orleans.fr/login?url=https://doi.org/10.1007/978-1-4419-9976-4 |z Accès Université d'Orléans | |
| 856 | 4 | |5 180339901:753965674 |u https://ezproxy.insa-cvl.fr/login?qurl=https://doi.org/10.1007/978-1-4419-9976-4 |z Accès INSA CVL | |
| 997 | |0 973966 |1 Livre numérique |a Ressource numérique |b INSA |b ENSA |c 0/Bibliothèque numérique/ |c 1/Bibliothèque numérique/Autre ressource numérique/ | ||