Microelectronic Test Structures for CMOS Technology
Microelectronic Test Structures for CMOS Technology and Products addresses the basic concepts of the design of test structures for incorporation within test-vehicles, scribe-lines, and CMOS products. The role of test structures in the development and monitoring of CMOS technologies and products has...
Enregistré dans:
| Auteurs principaux: | , |
|---|---|
| 格式: | Livre numérique |
| 語言: | Anglais |
| 出版: |
New York, NY :
Springer New York
2011.
Cham : Springer Nature |
| 在線閱讀: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| 提示: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Microelectronic Test Structures for CMOS Technology, Texte imprimé, 9781441993762 • Microelectronic Test Structures for CMOS Technology, Texte imprimé, 9781441993786 • Microelectronic Test Structures for CMOS Technology, Texte imprimé, 9781489990556 |
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| 008 | 111115s2011 xx ||| |||| 00| 0 eng d | ||
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| 020 | |a 9781441993779 | ||
| 020 | |a 9781441993779 | ||
| 041 | 0 | |a eng | |
| 082 | |a 621.381 | ||
| 100 | 1 | |a Bhushan, Manjul. | |
| 245 | 1 | 0 | |a Microelectronic Test Structures for CMOS Technology |c by Manjul Bhushan, Mark B. Ketchen. |
| 260 | |a New York, NY : |b Springer New York. | ||
| 260 | |a Cham : |b Springer Nature, |c 2011. | ||
| 500 | |a Archives Springer e-books (Licence nationale) | ||
| 500 | |a Archives Springer e-books (Licence nationale) | ||
| 505 | 0 | |a Introduction -- Test Structure Basics -- Resistors -- Capacitors -- MOSFETs -- Ring Oscillators -- High Speed Characterization -- Test Structures of SOI Technology -- Test Equipment and Measurements -- Data Analysis. | |
| 506 | |a Accès en ligne pour les établissements français bénéficiaires des licences nationales | ||
| 506 | |a Accès soumis à abonnement pour tout autre établissement | ||
| 506 | |a Conditions particulières de réutilisation pour les bénéficiaires des licences nationales. chttps://www.licencesnationales.fr/springer-nature-ebooks-contrat-licence-ln-2017 | ||
| 520 | |a Microelectronic Test Structures for CMOS Technology and Products addresses the basic concepts of the design of test structures for incorporation within test-vehicles, scribe-lines, and CMOS products. The role of test structures in the development and monitoring of CMOS technologies and products has become ever more important with the increased cost and complexity of development and manufacturing. In this timely volume, IBM scientists Manjul Bhushan and Mark Ketchen emphasize high speed characterization techniques for digital CMOS circuit applications and bridging between circuit performance and characteristics of MOSFETs and other circuit elements. Detailed examples are presented throughout, many of which are equally applicable to other microelectronic technologies as well. The authors overarching goal is to provide students and technology practitioners alike a practical guide to the disciplined design and use of test structures that give unambiguous information on the parametrics and performance of digital CMOS technology. | ||
| 700 | 1 | |a Ketchen, Mark B. |4 aut | |
| 776 | 0 | |t Microelectronic Test Structures for CMOS Technology |b Texte imprimé |z 9781441993762 | |
| 776 | 0 | |t Microelectronic Test Structures for CMOS Technology |b Texte imprimé |z 9781441993786 | |
| 776 | 0 | |t Microelectronic Test Structures for CMOS Technology |b Texte imprimé |z 9781489990556 | |
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