Accelerating test, validation and debug of high speed serial interfaces

High-Speed Serial Interface (HSSI) devices have become widespread in communications, from the embedded to high-performance computing systems, and from on-chip to a wide haul. Testing of HSSIs has been a challenging topic because of signal integrity issues, long test time and the need of expensive in...

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Autori principali: Fan, Yongquan, Zilic, Zeljko (Autore)
Natura: Livre numérique
Lingua:Anglais
Pubblicazione: Dordrecht : Springer Netherlands 2011.
Cham : Springer Nature
Accesso online:Accès sur la plateforme de l'éditeur
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Nota: Archives Springer e-books (Licence nationale)
Archives Springer e-books (Licence nationale)
Autres localisations: Voir dans le Sudoc
Edition sous un autre format:• Accelerating Test, Validation and Debug of High Speed Serial Interfaces, Texte imprimé, 9789048193974
• Accelerating Test, Validation and Debug of High Speed Serial Interfaces, Texte imprimé, 9789048193998
• Accelerating Test, Validation and Debug of High Speed Serial Interfaces, Texte imprimé, 9789400789739

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