X-Ray Microscopy II : :: SCD d'Orléans

X-Ray Microscopy II : Proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987

X-Ray Microscopy II : Proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987

Guardat en:

Dades bibliogràfiques
Altres autors:	Sayre, David, 1924-2012 (Col·laborador), Kirz, Janos (Col·laborador), Rarback, Harvey (Col·laborador), Howells, Malcolm (Col·laborador)
Format:	Livre numérique
Idioma:	Anglais
Publicat:	Cham : Springer International Publishing [20..]. Cham : Springer Nature
Accés en línia:	Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL
Nota:	Autre(s) contributeur(s) : Harvey Rarback Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale)
Autres localisations:	Voir dans le Sudoc
Edition sous un autre format:	• X-Ray Microscopy II, Proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987

Ítems similars

X-Ray Microscopy : Proceedings of the International Symposium, Göttingen, Fed. Rep. of Germany, September 14-16, 1983

X-ray microscopy. Proceedings of the Third International Conference, London, September 3-7, 1990
per: Michette, Alan G, 1950-, et al.

X-Ray Microscopy and Spectromicroscopy : Status Report from the Fifth International Conference, Würzburg, August 19-23, 1996

Scanning Electron Microscopy and X-ray Microanalysis : Third Edition
per: Goldstein, Joseph, 1939-...., chimiste, et al.

Three-dimensional X-ray diffraction microscopy : mapping polycrystals and their dynamics
per: Poulsen, Henning Friis

An Introduction to Microscopy by Means of Light, Electrons, X-Rays, or Ultrasound
per: Rochow, Theodore George, et al.

Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis
per: Echlin, Patrick
Publicat: (2009)

Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
per: Echlin, Patrick

Scanning Tunneling Microscopy II : Further Applications and Related Scanning Techniques

Scanning Tunneling Microscopy II : Further Applications and Related Scanning Techniques

Atomic Force Microscopy/Scanning Tunneling Microscopy

Confocal microscopy
Publicat: (1990)

Food microscopy
per: Vaughan, John Griffith, 1926-2005
Publicat: (1979)

Pharmaceutical Microscopy
per: Carlton, Robert Allen

Microscopy Techniques
per: Rietdorf, Jens

Polymer Microscopy
per: Sawyer, Linda C., 1944-, et al.

Journal of microscopy
Publicat: (1998)

Polymer Microscopy
per: Sawyer, Linda C., 1944-, et al.
Publicat: (2008)

Science of microscopy
per: Hawkes, Peter William, 1937-...., physicien
Publicat: (2007)

Digital microscopy
per: Sluder, Greenfield, 19..-, et al.
Publicat: (2013)

Microscopy and Analysis
Publicat: (2021)

Electron Microscopy
Publicat: (2021)

Confocal microscopy
Publicat: (1999)

Journal of Microscopy.

Applied Microscopy.

Immunofluorescence Microscopy.
Publicat: (2022)

Atomic Force Microscopy/Scanning Tunneling Microscopy 2

Atomic Force Microscopy/Scanning Tunneling Microscopy 3

Characterization of soil particles by X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), electron paramagnetic resonance (EPR) and transmission electron microscopy (TEM)
per: Karine Flogeac, et al.
Publicat: (2005)

Scanning electrochemical microscopy
Publicat: (2001)

Introduction to optical microscopy
per: Mertz, Jerome
Publicat: (2010)

Scanning Tunneling Microscopy

Electron Microscopy of Nanotubes

Field-Ion Microscopy
per: Wagner, R.

Microscopy research and technique.
Publicat: (1992)

Electron microscopy reviews.
Publicat: (2004)

Electron Microscopy of Polymers
per: Michler, Georg Hannes
Publicat: (2008)

Magnetic microscopy of nanostructures

Field-Ion Microscopy

Medical electron microscopy.
Publicat: (1993)

© 2021-2023 • Université d'Orléans, Service Commun de Documentation, 6 rue de Tours, 45072 Orléans cedex 2
+33(0) 2 38 41 71 84 • https://scd.univ-orleans.fr • Mentions légales