Kelvin probe force microscopy : measuring and compensating electrostatic forces
In the nearly 20 years of Kelvin probe force microscopy an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructur...
Salvato in:
| Altri autori: | , |
|---|---|
| Natura: | Livre numérique |
| Lingua: | Anglais |
| Pubblicazione: |
Berlin, Heidelberg :
Springer Berlin Heidelberg
[20..].
Cham : Springer Nature |
| Edizione: | 1st ed. 2012. |
| Serie: | Springer Series in Surface Sciences
48 |
| Soggetti: | |
| Accesso online: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Nota: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Kelvin probe force microscopy, measuring and compensating electrostatic forces, Sascha Sadewasser, Thilo Glatzel, editors, 2012, Heidelberg, Springer, 1 vol. (XIV-331 p.), Springer series in surface sciences, 978-3-642-22565-9 |
Sommario:
- Introduction I. Technical Aspects Experimental technique and working modes Phase Modulation Kelvin Probe Microscopy Data interpretation, spatial resolution and deconvolution Contribution of the numerical approach to Kelvin probe force microscopies Quantum mechanical simulations of electrostatic tip-sample interactions II. Selected Applications Surface properties of III-V semiconductors Electronic surface properties of semiconductors devices Optoelectronic studies of solar cells Electrical characterization of low dimensional systems (quantum/nano-structures) Electronic structure of molecular assemblies KPFM for biochemical analysis Local work function analysis of photo catalysts Kelvin probe force microscopy with atomic resolution Summary.
- Introduction
- I. Technical Aspects
- Experimental technique and working modes
- Phase Modulation Kelvin Probe Microscopy
- Data interpretation, spatial resolution and deconvolution
- Contribution of the numerical approach to Kelvin probe force microscopies
- Quantum mechanical simulations of electrostatic tip-sample interactions
- II. Selected Applications
- Surface properties of III-V semiconductors
- Electronic surface properties of semiconductors devices
- Optoelectronic studies of solar cells
- Electrical characterization of low dimensional systems (quantum/nano-structures)
- Electronic structure of molecular assemblies
- KPFM for biochemical analysis
- Local work function analysis of photo catalysts
- Kelvin probe force microscopy with atomic resolution
- Summary