Mono-cycle photonics and optical scanning tunneling microscopy : route to femtosecond angstrom technology

"Mono-Cycle Photonics and Optical Scanning Tunneling Microscopy" deals with both the ultrashort laser-pulse technology in the few- to mono-cycle region and the laser-surface-controlled scanning-tunneling microscopy (STM) extending into the spatiotemporal extreme technology. The former cove...

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Dettagli Bibliografici
Autore principale: Yamashita, Mikio
Altri autori: Shigekawa, Hidemi (Direttore editoriale), Morita, Ryuji (Direttore editoriale)
Natura: Livre numérique
Lingua:Anglais
Pubblicazione: Berlin, Heidelberg : Springer Berlin Heidelberg [20..].
Cham : Springer Nature
Edizione:1st ed. 2005.
Serie:Springer Series in Optical Sciences 99
Soggetti:
Accesso online:Accès sur la plateforme de l'éditeur
Accès sur la plateforme Istex
Accès Université d'Orléans
Accès INSA CVL
Nota: Archives Springer e-books (Licence nationale)
Archives Springer e-books (Licence nationale)
Autres localisations: Voir dans le Sudoc
Edition sous un autre format:• Mono-cycle photonics and optical scanning tunneling microscopy, route to Femtosecond Ångstrom technology, M. Yamashita, H. Shigekawa, R. Morita (eds.), Berlin, Springer, 2005, XX-389 p., Springer series in optical sciences, 3-540-21446-1
• Mono-Cycle Photonics and Optical Scanning Tunneling Microscopy, Texte imprimé, 9783642059834
• Mono-Cycle Photonics and Optical Scanning Tunneling Microscopy, Texte imprimé, 9783540801511
Sommario:
  • Nonlinear Propagation Theory for Few-to-Mono Optical-Cycle Pulses beyond the Slowly-Varying-Envelope Approximation (SVEA) Generation of Ultrabroadband Optical Pulses Active Chirp Compensation for Ultrabroadband Optical Pulses Amplitude and Phase Characterization of Few-to-Mono Optical-Cycle Pulses Feedback Field Control for Optical Pulse Generation in the Monocycle Region Field Manipulation of Ultrabroadband Optical Pulses Fundamental of Laser-Assisted Scanning Tunneling Microscopy (STM) Spatially-Resolved Surface Photovoltage Measurement Atomic-Level Surface Phenomena Controlled by Femtosecond Optical Pulses Femtosecond-Time-Resolved Scanning Tunneling Microscopy Outlook