Introduction to Advanced System-on-Chip Test Design and Optimization
SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automat...
محفوظ في:
| المؤلف الرئيسي: | |
|---|---|
| التنسيق: | Livre numérique |
| اللغة: | Anglais |
| منشور في: |
New York, NY :
Springer US
[20..].
Cham : Springer Nature |
| الطبعة: | 1st ed. 2005. |
| سلاسل: | Frontiers in Electronic Testing
29 |
| الوصول للمادة أونلاين: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| ملاحظة: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Introduction to Advanced System-on-Chip Test Design and Optimization, by Erik Larsson., Boston, MA, Springer US, 2005, Frontiers in Electronic Testing, 978-1-40203-207-3 • Introduction to Advanced System-on-Chip Test Design and Optimization, Texte imprimé, 9781441952691 • Cardiorespiratory and motor coordination, [XXXI International congress of IUPS Helsinki 1989 satellite symposium, Espoo, 15-17 July 1989], ed. H.-P. Koepchen, T. Huopaniemi, Berlin, Springer-Verlag, 1991, xxi, 337 p, 3-540-52279-4 |
| الملخص: | SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process |
|---|---|
| وصف المادة: | Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| ردمك: | 9780387256245 |
| وصول: | Accès en ligne pour les établissements français bénéficiaires des licences nationales Accès soumis à abonnement pour tout autre établissement Conditions particulières de réutilisation pour les bénéficiaires des licences nationales. https://www.licencesnationales.fr/springer-nature-ebooks-contrat-licence-ln-2017 |