Strain Effect in Semiconductors : Theory and Device Applications

Strain Effect in Semiconductors: Theory and Device Applications presents the fundamentals and applications of strain in semiconductors and semiconductor devices that is relevant for strain-enhanced advanced CMOS technology and strain-based piezoresistive MEMS transducers. The book discusses relevant...

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Hlavní autoři: Sun, Yongke, Thompson, Scott E. (Autor), Nishida, Toshikazu, 1963- (Autor)
Médium: Livre numérique
Jazyk:Anglais
Vydáno: Boston, MA : Springer US [20..].
Cham : Springer Nature
Vydání:First.
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Poznámka: Archives Springer e-books (Licence nationale)
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Edition sous un autre format:• Strain effect in semiconductors, theory and device applications, Yongke Sun, Scott Thompson, Toshikazu Nishida, New York, Springer, 2010, 1 vol. (XII-350 p.), 978-1-441-90551-2
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245 1 0 |a Strain Effect in Semiconductors :  |b Theory and Device Applications   |c by Yongke Sun, Scott E. Thompson, Toshikazu Nishida. 
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505 1 |a Overview: The Age of Strained Devices Band Structures of Strained Semiconductors Stress, Strain, Piezoresistivity, and Piezoelectricity Strain and Semiconductor Crystal Symmetry Band Structures of Strained Semiconductors Low-Dimensional Semiconductor Structures Transport Theory of Strained Semiconductors Semiconductor Transport Strain in Semiconductor Devices Strain in Electron Devices Piezoresistive Strain Sensors Strain Effects on Optoelectronic Devices 
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520 |a Strain Effect in Semiconductors: Theory and Device Applications presents the fundamentals and applications of strain in semiconductors and semiconductor devices that is relevant for strain-enhanced advanced CMOS technology and strain-based piezoresistive MEMS transducers. The book discusses relevant applications of strain while also focusing on the fundamental physics as they pertain to bulk, planar, and scaled nano-devices. Lead authors Yongke Sun, Scott Thompson and Toshikazu Nishida also: Treat strain physics at both the qualitative overview level as well as provide detailed fundamentals Explain strain physics relevant to logic devices as well as strain-based MEMS This book is relevant to current strained Si logic technology, as well as for understanding the physics and scaling of future strain nano-scale devices. It is perfect for practicing device engineers at semiconductor manufacturers, as well as graduate students studying device physics at universities 
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700 1 |a Nishida, Toshikazu,  |d 1963-  |4 aut 
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