Strain Effect in Semiconductors : Theory and Device Applications

Strain Effect in Semiconductors: Theory and Device Applications presents the fundamentals and applications of strain in semiconductors and semiconductor devices that is relevant for strain-enhanced advanced CMOS technology and strain-based piezoresistive MEMS transducers. The book discusses relevant...

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Autori principali: Sun, Yongke, Thompson, Scott E. (Autore), Nishida, Toshikazu, 1963- (Autore)
Natura: Livre numérique
Lingua:Anglais
Pubblicazione: Boston, MA : Springer US [20..].
Cham : Springer Nature
Edizione:First.
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Nota: Archives Springer e-books (Licence nationale)
Archives Springer e-books (Licence nationale)
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Edition sous un autre format:• Strain effect in semiconductors, theory and device applications, Yongke Sun, Scott Thompson, Toshikazu Nishida, New York, Springer, 2010, 1 vol. (XII-350 p.), 978-1-441-90551-2
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Riassunto:Strain Effect in Semiconductors: Theory and Device Applications presents the fundamentals and applications of strain in semiconductors and semiconductor devices that is relevant for strain-enhanced advanced CMOS technology and strain-based piezoresistive MEMS transducers. The book discusses relevant applications of strain while also focusing on the fundamental physics as they pertain to bulk, planar, and scaled nano-devices. Lead authors Yongke Sun, Scott Thompson and Toshikazu Nishida also: Treat strain physics at both the qualitative overview level as well as provide detailed fundamentals Explain strain physics relevant to logic devices as well as strain-based MEMS This book is relevant to current strained Si logic technology, as well as for understanding the physics and scaling of future strain nano-scale devices. It is perfect for practicing device engineers at semiconductor manufacturers, as well as graduate students studying device physics at universities
Descrizione del documento:Archives Springer e-books (Licence nationale)
Archives Springer e-books (Licence nationale)
ISBN:9781441905529
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