Sample preparation handbook for transmission electron microscopy : techniques
This two-volume Handbook is a comprehensive guide to sample preparation for the transmission electron microscope. Sample Preparation Handbook for Transmission Electron Microscopy: Techniques describes 14 different preparation techniques, including 22 detailed protocols for preparing thin slices for...
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| Hlavní autoři: | , , , , |
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| Médium: | Livre numérique |
| Jazyk: | Anglais |
| Vydáno: |
New York, NY :
Springer New York : Springer e-books : Imprint: Springer : Springer e-books
[20..].
Cham : Springer Nature |
| On-line přístup: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
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Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Sample Preparation Handbook for Transmission Electron Microscopy, Texte imprimé, 9781441959744 |
| Shrnutí: | This two-volume Handbook is a comprehensive guide to sample preparation for the transmission electron microscope. Sample Preparation Handbook for Transmission Electron Microscopy: Techniques describes 14 different preparation techniques, including 22 detailed protocols for preparing thin slices for TEM analysis. Compatibility and pre-treatments are also discussed. Experimental conditions and guidelines, options and variations, advantages and constraints, technical hints from the authors years of experience, common artifacts, and theoretical issues are all considered. Particular attention is given to the type of material, conditioning, compatible analysis of a given preparation, and risks. This practical and authoritative reference companion deserves a place on the bench in every TEM lab. Key Features of the Handbook: Combines all of the latest techniques for the preparation of mineral to biological samples Compares techniques in terms of their application areas, limitations, artifacts, and types of analysis (macroscopic, atomic, or molecular level) Describes physical characteristics, chemistry, structure/texture, and orientation properties of materials in relation to the most appropriate type of TEM analysis Links to a complementary interactive database website which is available to scientists worldwide* Written by authors with 100 years of combined experience in electron microscopy *http://temsamprep.in2p3.fr |
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| Popis jednotky: | Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| ISBN: | 9781441959751 |
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