Test pattern generation using boolean proof engines
After producing a chip, the functional correctness of the integrated circuit has to be checked. Otherwise products with malfunctions would be delivered to customers, which is not acceptable for any company. Many algorithms for "Automatic Test Pattern Generation" (ATPG) have been proposed i...
Enregistré dans:
| Auteurs principaux: | , , , |
|---|---|
| Format: | Livre numérique |
| Sprog: | Anglais |
| Udgivet: |
Dordrecht :
Springer Netherlands
2009.
Cham : Springer Nature |
| Online adgang: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Kommentar: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Test pattern generation using Boolean proof engines, Rolf Drechsler, Stephan Eggersglüb, Görschwin Fey, Daniel Tille, Dordrecht, Springer, 2009, 1 volume (xii-192 pages), 978-90-481-2359-9 • Test Pattern Generation using Boolean Proof Engines, Texte imprimé, 9789048123735 • Test Pattern Generation using Boolean Proof Engines, Texte imprimé, 9789048184910 |
Indholdsfortegnelse:
- Preliminaries
- Boolean Satisfiability
- SAT-Based ATPG
- Learning Techniques
- Multiple-Valued Logic
- Improved Circuit-to-CNF Conversion
- Branching Strategies
- Integration into Industrial Flow
- Delay Faults
- Summary and Outlook.