Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
This Handbook is a complete guide to preparing a wide variety of specimens for the scanning electron microscope and x-ray microanalyzers. Specimens range from inorganic, organic, biological, and geological samples to materials such as metals, polymers, and semiconductors which can exist as solids, l...
Enregistré dans:
| Auteur principal: | |
|---|---|
| Format: | Livre numérique |
| Langue: | Anglais |
| Publié: |
New York, NY :
Springer US
[20..].
Cham : Springer Nature |
| Édition: | 1st ed. 2009. |
| Accès en ligne: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Note: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis, Patrick Echlin, New York, Springer, 2009, 1 vol. (XI- 330 p.) |
Table des matières:
- Sample Collection and Selection Sample Preparation Tools Sample Support Sample Embedding ?and Mounting Sample Exposure Sample Dehydration Sample Stabilization for Imaging in the SEM Sample Stabilization to Preserve Chemical Identity Sample Cleaning Sample Surface Charge Elimination Sample Artifacts and Damage Additional Sources of Information