Thermal and Power Management of Integrated Circuits

Thermal modeling of high performance circuits and systems is a crucial component for thermal and power management. The VLSI community is currently lacking a methodology to model and estimate junction temperature at any level of design other than low-level (transistor-level) circuits. The accuracy of...

وصف كامل

محفوظ في:
التفاصيل البيبلوغرافية
المؤلفون الرئيسيون: Vassighi, Arman, 1966-, Sachdev, Manoj (مؤلف)
التنسيق: Livre numérique
اللغة:Anglais
منشور في: New York, NY : Springer US 2006.
Cham : Springer Nature
سلاسل:Integrated Circuits and Systems
الوصول للمادة أونلاين:Accès sur la plateforme de l'éditeur
Accès sur la plateforme Istex
Accès Université d'Orléans
Accès INSA CVL
ملاحظة: Archives Springer e-books (Licence nationale)
Archives Springer e-books (Licence nationale)
Autres localisations: Voir dans le Sudoc
Edition sous un autre format:• Thermal and Power Management of Integrated Circuits, Texte imprimé, 9781441938329
• Thermal and Power Management of Integrated Circuits, Texte imprimé, 9780387506920
• Thermal and Power Management of Integrated Circuits, Texte imprimé, 9780387257624
LEADER 03961nam a22003497a 4500
001 937844
008 080410s2006 xx ||| |||| 00| 0 eng d
009 PPN123106982
020 |a 9780387297491 
041 0 |a eng 
082 |a 621.3815 
100 1 |a Vassighi, Arman,  |d 1966- 
245 1 0 |a Thermal and Power Management of Integrated Circuits   |c by Arman Vassighi, Manoj Sachdev. 
260 |a New York, NY :  |b Springer US. 
260 |a Cham :  |b Springer Nature,  |c 2006. 
490 0 |a Integrated Circuits and Systems  |x 1558-9420 
500 |a Archives Springer e-books (Licence nationale) 
500 |a Archives Springer e-books (Licence nationale) 
505 0 |a Power, Junction Temperature, and Reliability -- Burn-in as a Reliability Screening Test -- Thermal and Electrothermal Modeling -- Thermal Runaway and Thermal Management -- Low Temperature CMOS Operation. 
506 |a Accès en ligne pour les établissements français bénéficiaires des licences nationales 
506 |a Accès soumis à abonnement pour tout autre établissement 
506 |a Conditions particulières de réutilisation pour les bénéficiaires des licences nationales. chttps://www.licencesnationales.fr/springer-nature-ebooks-contrat-licence-ln-2017 
520 |a Thermal modeling of high performance circuits and systems is a crucial component for thermal and power management. The VLSI community is currently lacking a methodology to model and estimate junction temperature at any level of design other than low-level (transistor-level) circuits. The accuracy of thermal modeling has a substantial effect on the accuracy of thermal-management studies at the architectural level. Without this essential modeling capability, architecture researchers are limited to inaccurate estimation techniques, which are not suitable for thermal management of integrated circuits. In Thermal and Power Management of Integrated Circuits, power and thermal management issues in integrated circuits during normal operating conditions and stress operating conditions are addressed. Thermal management in VLSI circuits is becoming an integral part of the design, test, and manufacturing. Proper thermal management is the key to achieve high performance, quality and reliability. Performance and reliability of integrated circuits are strong functions of the junction temperature. A small increase in junction temperature may result in significant reduction in the device lifetime. This book reviews the significance of the junction temperature as a reliability measure under nominal and burn-in conditions. The latest research in the area of electro-thermal modeling of integrated circuits will also be presented. Recent models and associated CAD tools are covered and various techniques at the circuit and system levels are reviewed. Subsequently, the authors provide an insight into the concept of thermal runaway and how it may best be avoided. A section on low temperature operation of integrated circuits concludes the book. 
700 1 |a Sachdev, Manoj.  |4 aut 
776 0 |t Thermal and Power Management of Integrated Circuits  |b Texte imprimé  |z 9781441938329 
776 0 |t Thermal and Power Management of Integrated Circuits  |b Texte imprimé  |z 9780387506920 
776 0 |t Thermal and Power Management of Integrated Circuits  |b Texte imprimé  |z 9780387257624 
856 4 |q PDF  |u https://doi.org/10.1007/0-387-29749-9  |z Accès sur la plateforme de l'éditeur 
856 4 |u https://revue-sommaire.istex.fr/ark:/67375/8Q1-WHZF3XR4-N  |z Accès sur la plateforme Istex 
856 4 |5 452349901:747906378  |u https://ezproxy.univ-orleans.fr/login?url=https://dx.doi.org/10.1007/0-387-29749-9  |z Accès Université d'Orléans 
856 4 |5 180339901:750919485  |u https://ezproxy.insa-cvl.fr/login?qurl=https://dx.doi.org/10.1007/0-387-29749-9  |z Accès INSA CVL 
997 |0 937844  |1 Livre numérique  |a Ressource numérique  |b INSA  |b ENSA  |c 0/Bibliothèque numérique/  |c 1/Bibliothèque numérique/Autre ressource numérique/