Gettering defects in semiconductors
Gettering Defects in Semiconductors fulfills three basic purposes: to systematize the experience and research in exploiting various gettering techniques in microelectronics and nanoelectronics; to identify new directions in research, particularly to enhance the perspective of professionals and young...
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| Hlavní autoři: | , |
|---|---|
| Médium: | Livre numérique |
| Jazyk: | Anglais |
| Vydáno: |
Berlin, Heidelberg :
Springer Berlin Heidelberg
[20..].
Cham : Springer Nature |
| Vydání: | 1st ed. 2005. |
| Edice: | Springer Series in Advanced Microelectronics
19 |
| On-line přístup: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Poznámka: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Gettering defects in semiconductors, V.A. Perevostchikov, V.D. Skoupov, Berlin, Springer, 2005, 1 vol. (XV-386 p.), Springer series in advanced microelectronics, 3-540-26244-X • Gettering Defects in Semiconductors, Texte imprimé, 9783540811954 • Gettering Defects in Semiconductors, Texte imprimé, 9783642065705 • Gettering defects in semiconductors, V.A. Perevostchikov, V.D. Skoupov, Berlin, Springer, 2005, 1 vol. (XV-386 p.), Springer series in advanced microelectronics, 3-540-26244-X |
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| 100 | 1 | |a Perevostchikov, Viktor A. | |
| 245 | 1 | 0 | |a Gettering defects in semiconductors |c by Victor A. Perevoschikov, Vladimir D. Skoupov. |
| 250 | |a 1st ed. 2005. | ||
| 260 | |a Berlin, Heidelberg : |b Springer Berlin Heidelberg. | ||
| 260 | |a Cham : |b Springer Nature, |c [20..]. | ||
| 490 | 0 | |a Springer Series in Advanced Microelectronics |v 19 |x 2197-6643 | |
| 500 | |a Archives Springer e-books (Licence nationale) | ||
| 500 | |a Archives Springer e-books (Licence nationale) | ||
| 505 | 1 | |a Basic technological processes and defect formation in the components of device structures Effects of defects on electrophysical and functional parameters in semiconducting structures and devices Techniques for high-temperature gettering Physical foundations for low-temperature gettering techniques | |
| 506 | |a Accès en ligne pour les établissements français bénéficiaires des licences nationales | ||
| 506 | |a Accès soumis à abonnement pour tout autre établissement | ||
| 506 | |a Conditions particulières de réutilisation pour les bénéficiaires des licences nationales. https://www.licencesnationales.fr/springer-nature-ebooks-contrat-licence-ln-2017 | ||
| 520 | |a Gettering Defects in Semiconductors fulfills three basic purposes: to systematize the experience and research in exploiting various gettering techniques in microelectronics and nanoelectronics; to identify new directions in research, particularly to enhance the perspective of professionals and young researchers and specialists; to fill a gap in the contemporary literature on the underlying semiconductor-material theory. The authors address not only well-established gettering techniques but also describe contemporary trends in gettering technologies from an international perspective. The types and properties of structural defects in semiconductors, their generating and their transforming mechanisms during fabrication are described. The primary emphasis is placed on classifying and describing specific gettering techniques, their specificity arising from both their position in a general technological process and the regimes of their application. This book addresses both engineers and material scientists interested in semiconducting materials theory and also undergraduate and graduate students in solid state microelectronics and nanoelectronics. A comprehensive list of references provides readers with direction for further reading | ||
| 700 | 1 | |a Skupov, Vladimir Dmitrievich. |4 aut | |
| 776 | 0 | |0 107957167 |t Gettering defects in semiconductors |f V.A. Perevostchikov, V.D. Skoupov |c Berlin |n Springer |d 2005 |p 1 vol. (XV-386 p.) |s Springer series in advanced microelectronics |z 3-540-26244-X | |
| 776 | 0 | |t Gettering Defects in Semiconductors |b Texte imprimé |z 9783540811954 | |
| 776 | 0 | |t Gettering Defects in Semiconductors |b Texte imprimé |z 9783642065705 | |
| 776 | 0 | |0 107957167 |t Gettering defects in semiconductors |f V.A. Perevostchikov, V.D. Skoupov |c Berlin |n Springer |d 2005 |p 1 vol. (XV-386 p.) |s Springer series in advanced microelectronics |z 3-540-26244-X | |
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