Gettering defects in semiconductors
Gettering Defects in Semiconductors fulfills three basic purposes: to systematize the experience and research in exploiting various gettering techniques in microelectronics and nanoelectronics; to identify new directions in research, particularly to enhance the perspective of professionals and young...
সংরক্ষণ করুন:
| প্রধান লেখক: | , |
|---|---|
| বিন্যাস: | Livre numérique |
| ভাষা: | Anglais |
| প্রকাশিত: |
Berlin, Heidelberg :
Springer Berlin Heidelberg
[20..].
Cham : Springer Nature |
| সংস্করন: | 1st ed. 2005. |
| মালা: | Springer Series in Advanced Microelectronics
19 |
| অনলাইন ব্যবহার করুন: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| টীকা: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Gettering defects in semiconductors, V.A. Perevostchikov, V.D. Skoupov, Berlin, Springer, 2005, 1 vol. (XV-386 p.), Springer series in advanced microelectronics, 3-540-26244-X • Gettering Defects in Semiconductors, Texte imprimé, 9783540811954 • Gettering Defects in Semiconductors, Texte imprimé, 9783642065705 • Gettering defects in semiconductors, V.A. Perevostchikov, V.D. Skoupov, Berlin, Springer, 2005, 1 vol. (XV-386 p.), Springer series in advanced microelectronics, 3-540-26244-X |
| সংক্ষিপ্ত: | Gettering Defects in Semiconductors fulfills three basic purposes: to systematize the experience and research in exploiting various gettering techniques in microelectronics and nanoelectronics; to identify new directions in research, particularly to enhance the perspective of professionals and young researchers and specialists; to fill a gap in the contemporary literature on the underlying semiconductor-material theory. The authors address not only well-established gettering techniques but also describe contemporary trends in gettering technologies from an international perspective. The types and properties of structural defects in semiconductors, their generating and their transforming mechanisms during fabrication are described. The primary emphasis is placed on classifying and describing specific gettering techniques, their specificity arising from both their position in a general technological process and the regimes of their application. This book addresses both engineers and material scientists interested in semiconducting materials theory and also undergraduate and graduate students in solid state microelectronics and nanoelectronics. A comprehensive list of references provides readers with direction for further reading |
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| উপাদানের বিবরণ: | Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| আইসবিএন: | 9783540294993 |
| আইএসএসএন: | 2197-6643 |
| প্রবেশাধিকার: | Accès en ligne pour les établissements français bénéficiaires des licences nationales Accès soumis à abonnement pour tout autre établissement Conditions particulières de réutilisation pour les bénéficiaires des licences nationales. https://www.licencesnationales.fr/springer-nature-ebooks-contrat-licence-ln-2017 |