Gettering defects in semiconductors
Gettering Defects in Semiconductors fulfills three basic purposes: to systematize the experience and research in exploiting various gettering techniques in microelectronics and nanoelectronics; to identify new directions in research, particularly to enhance the perspective of professionals and young...
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| Auteurs principaux: | , |
|---|---|
| Format: | Livre numérique |
| Langue: | Anglais |
| Publié: |
Berlin, Heidelberg :
Springer Berlin Heidelberg
[20..].
Cham : Springer Nature |
| Édition: | 1st ed. 2005. |
| Collection: | Springer Series in Advanced Microelectronics
19 |
| Accès en ligne: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Note: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Gettering defects in semiconductors, V.A. Perevostchikov, V.D. Skoupov, Berlin, Springer, 2005, 1 vol. (XV-386 p.), Springer series in advanced microelectronics, 3-540-26244-X • Gettering Defects in Semiconductors, Texte imprimé, 9783540811954 • Gettering Defects in Semiconductors, Texte imprimé, 9783642065705 • Gettering defects in semiconductors, V.A. Perevostchikov, V.D. Skoupov, Berlin, Springer, 2005, 1 vol. (XV-386 p.), Springer series in advanced microelectronics, 3-540-26244-X |