Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis
שמור ב:
| מחבר ראשי: | |
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| פורמט: | Livre papier |
| שפה: | Anglais |
| יצא לאור: |
New York :
Springer
cop. 2009.
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| נושאים: | |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis, Ressource électronique, by Patrick Echlin., Boston, MA, Springer-Verlag US, Springer e-books, 2009, Chemistry and Materials Science (Springer-11644; ZDB-2-CMS), 978-0-387-85731-2 |
תוכן הענינים:
- Sample collection and selection Sample preparation tools Sample support Sample embedding and mounting Sample exposure Sample dehydration Sample stabilization for imaging in the SEM Sample stabilization to preserve chemical identity Sample cleaning Sample surface charge elimination Sample artifacts and damage Additional sources of information