Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis

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Detalles Bibliográficos
Autor Principal: Echlin, Patrick
Formato: Livre papier
Idioma:Anglais
Publicado: New York : Springer cop. 2009.
Sujets:
Autres localisations: Voir dans le Sudoc
Edition sous un autre format:• Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis, Ressource électronique, by Patrick Echlin., Boston, MA, Springer-Verlag US, Springer e-books, 2009, Chemistry and Materials Science (Springer-11644; ZDB-2-CMS), 978-0-387-85731-2
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082 |a 502.285 
084 |a QH212.S3. E24 2009 
100 1 |a Echlin, Patrick. 
245 1 0 |a Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis   |c Patrick Echlin. 
260 |a New York :  |b Springer,  |c cop. 2009. 
300 |a 1 vol. (XI- 330 p.) :  |b ill. , couv. ill en coul. ;  |c 27 cm. 
504 |a Bibliogr. p. 317-322. Index. 
505 1 |a Sample collection and selection Sample preparation tools Sample support Sample embedding and mounting Sample exposure Sample dehydration Sample stabilization for imaging in the SEM Sample stabilization to preserve chemical identity Sample cleaning Sample surface charge elimination Sample artifacts and damage Additional sources of information 
650 |a Microscopie électronique à balayage  |x Technique 
650 |a Microanalyse par émission X  |x Technique 
776 0 |0 13287184X  |t Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis  |b Ressource électronique  |f by Patrick Echlin.  |c Boston, MA  |n Springer-Verlag US  |n Springer e-books  |d 2009  |s Chemistry and Materials Science (Springer-11644; ZDB-2-CMS)  |z 978-0-387-85731-2 
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