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|z 9780387857305 (rel.)
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| 020 |
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|z 0387857303 (rel.)
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| 024 |
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|a 9780387857305
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| 041 |
0 |
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|a eng
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| 082 |
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|a 502.285
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| 084 |
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|a QH212.S3. E24 2009
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| 100 |
1 |
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|a Echlin, Patrick.
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| 245 |
1 |
0 |
|a Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis
|c Patrick Echlin.
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| 260 |
|
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|a New York :
|b Springer,
|c cop. 2009.
|
| 300 |
|
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|a 1 vol. (XI- 330 p.) :
|b ill. , couv. ill en coul. ;
|c 27 cm.
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| 504 |
|
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|a Bibliogr. p. 317-322. Index.
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| 505 |
1 |
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|a Sample collection and selection Sample preparation tools Sample support Sample embedding and mounting Sample exposure Sample dehydration Sample stabilization for imaging in the SEM Sample stabilization to preserve chemical identity Sample cleaning Sample surface charge elimination Sample artifacts and damage Additional sources of information
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| 650 |
|
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|a Microscopie électronique à balayage
|x Technique
|
| 650 |
|
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|a Microanalyse par émission X
|x Technique
|
| 776 |
0 |
|
|0 13287184X
|t Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
|b Ressource électronique
|f by Patrick Echlin.
|c Boston, MA
|n Springer-Verlag US
|n Springer e-books
|d 2009
|s Chemistry and Materials Science (Springer-11644; ZDB-2-CMS)
|z 978-0-387-85731-2
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| 997 |
|
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|0 368884
|1 Livre papier
|a Ressource papier
|c 0/Orléans/
|c 1/Orléans/BU Sciences, Technologies, STAPS/
|z Orléans, BU Sciences, Technologies, STAPS, 502.82 ECH
|