Point Defects in Semiconductors II : :: SCD d'Orléans

Point Defects in Semiconductors II : Experimental Aspects

Point Defects in Semiconductors II : Experimental Aspects

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書誌詳細
主要な著者:	Bourgoin, Jacques, 1938-...., physicien, Lannoo, Michel, 1942-...., physicien (著者)
フォーマット:	Livre numérique
言語:	Anglais
出版事項:	Cham : Springer International Publishing [20..]. Cham : Springer Nature
オンライン･アクセス:	Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL
注記:	Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale)
Autres localisations:	Voir dans le Sudoc
Edition sous un autre format:	• Point Defects in Semiconductors II, Experimental Aspects

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